| Description | | | | | | Measurement Capability
- 6½ digit resolution
- 10 measurement functions: DC/AC voltage, DC/AC current, 2- and 4-wire resistance, diode, continuity, frequency, period
- Basic accuracy: 0.0035% DC, 0.06% AC
- 1000 V max voltage input, 3 A max current input
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| Content | | GW INSTEK rolls out the new generation Dual Measurement Multimeter -- the GDM-834x series, which has two models -GDM-8341 and GDM 8342. Its exceptional features include 50,000 counts, VFD dual-display, 0.02% basic DC voltage accuracy and a USB protocol connector to provide users with measurement precision, lucid data observation, and the convenience to connect with the personal computer. The GDM-834x series not only supports the fundamental measurement items provided by general multimeters, but also equips with capacitance and temperature measurement functions. Furthermore, the GDM-834x series also provides many auxiliary functions to meet the measurement requirements for manufacturing process tests, educational experiments and testing facilities. | Current probe compatible with oscilloscope series: GDS-3000/2000A/1000A-U. No battery/power supply required. | The GCP-206P two-channel current probe power supplies designed for the GCP-530 and GCP-1030 clamp current probes. The power supplies are ideal for when power is not available from an oscilloscope. Also use for general current measurement applications. | GW INSTEK rolls out the new generation Dual Measurement Multimeter -- the GDM-834x series, which has two models -GDM-8341 and GDM 8342. Its exceptional features include 50,000 counts, VFD dual-display, 0.02% basic DC voltage accuracy and a USB protocol connector to provide users with measurement precision, lucid data observation, and the convenience to connect with the personal computer. The GDM-834x series not only supports the fundamental measurement items provided by general multimeters, but also equips with capacitance and temperature measurement functions. Furthermore, the GDM-834x series also provides many auxiliary functions to meet the measurement requirements for manufacturing process tests, educational experiments and testing facilities. | |
