| Content | | GW INSTEK rolls out the new generation Dual Measurement Multimeter -- the GDM-834x series, which has two models -GDM-8341 and GDM 8342. Its exceptional features include 50,000 counts, VFD dual-display, 0.02% basic DC voltage accuracy and a USB protocol connector to provide users with measurement precision, lucid data observation, and the convenience to connect with the personal computer. The GDM-834x series not only supports the fundamental measurement items provided by general multimeters, but also equips with capacitance and temperature measurement functions. Furthermore, the GDM-834x series also provides many auxiliary functions to meet the measurement requirements for manufacturing process tests, educational experiments and testing facilities. | With a flat frequency response, low noise and low insertion loss, the GCP-530 and GCP-1030 clamp-on probes are ideal for measuring steady state or transient current in amplifiers, inverters, electric motors, switching power supplies, controllers, sensors, LCD displays and electronic ballasts. For low current measurements, the high signal-to-noise ratio also makes the GCP-530 and GCP-1030 current probes ideal solutions. | Current probe compatible with oscilloscope series: GDS-3000/2000A/1000A-U. No battery/power supply required. | GW INSTEK rolls out the new generation Dual Measurement Multimeter -- the GDM-834x series, which has two models -GDM-8341 and GDM 8342. Its exceptional features include 50,000 counts, VFD dual-display, 0.02% basic DC voltage accuracy and a USB protocol connector to provide users with measurement precision, lucid data observation, and the convenience to connect with the personal computer. The GDM-834x series not only supports the fundamental measurement items provided by general multimeters, but also equips with capacitance and temperature measurement functions. Furthermore, the GDM-834x series also provides many auxiliary functions to meet the measurement requirements for manufacturing process tests, educational experiments and testing facilities. | |
