Megohmmeter Model 6505 (Digital, Analog Bargraph, Backlight, 500V, 1000V, 2500V, 5000V, Auto DAR/PI)
Available for Quote
Quick Comparison
| Settings | Megohmmeter Model 6505 (Digital, Analog Bargraph, Backlight, 500V, 1000V, 2500V, 5000V, Auto DAR/PI) remove | Clamp-on Meter Model 203 (TRMS, 1000VAC/DC, 600AAC/900ADC, Ohms, Continuity, Temperature) remove | Clamp-on Leakage Current Meter Model 566 remove | AEMC 6420 Micro-Ohmmeter, 10-Amp, 1µ Ohms to 400 Ohms remove | Calibration of AEMC 6416 Ground Resistance Tester NIST Calibration with Certificate remove | Power Clamp-on Meter Model 205 (TRMS, 1000VAC/DC, 600AAC/900ADC, Ohms, Continuity, Phase Rotation, Power, THD) remove | ||||||||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Image | |  |  |  |  |  | ||||||||||||||||||||||||
| SKU | N_AEMC 6505 | N_AEMC 203 | N_AEMC 566 | N_AEMC 6240 | C_AEMC 6416 | N_AEMC 205 | ||||||||||||||||||||||||
| Rating | ||||||||||||||||||||||||||||||
| Price | Available for Quote | Available for Quote | Available for Quote | Available for Quote | Available for Quote | Available for Quote | ||||||||||||||||||||||||
| Stock | ||||||||||||||||||||||||||||||
| Availability | ||||||||||||||||||||||||||||||
| Add to cart | ||||||||||||||||||||||||||||||
| Description | All equipment calibrations do not include any equipment warranty. Equipment that has any visible sign of damage will be documented and the customer will be notified before any services are performed. Any needed repairs will be quoted separately. All of our items will ship with Warranty Void tamper resistant seals. If these seals have been removed or tampered with, the Calibration will be void. | |||||||||||||||||||||||||||||
| Content | ||||||||||||||||||||||||||||||
| Weight | 23 | 9 | 9 | 10 | 3 | 9 | ||||||||||||||||||||||||
| Dimensions | 12 × 10 × 8 in | 6 × 6 × 12 in | 6 × 6 × 12 in | 12 × 12 × 10 in | 6 × 10 × 4 in | 6 × 6 × 12 in | ||||||||||||||||||||||||
| Additional information |
|
|
|
|
|
|
